The I&M Society is aimed at advancing the measurement science and metrology by developing new measurement methods, new methods for the characterization of the measurement results, and electrical and electronic instruments for the purpose of measuring, monitoring or recording various physical phenomena that may or may not be of an electrical nature.
The IEEE Instrumentation and Measurement Society supports the I&M community with several high quality activities, including, but not restricted to, Publications, Conferences, Technical Committees, Standards. The Society is part of the IEEE and offers its members the services of IEEE, including access to the IEEE Xplore service.
These pages provide an insight on the Society's activities and are the direct link with its Members and practitioners of Instrumentation and Measurement.
We are also happy to announce that the I&M Magazine is now available online! Please click here to view articles from the latest issue.
I&M ADCOM elections for the 2008-2011 term are completed and the results are in. Congratulations to the winning candidates:
Ruth A. Dyer
Pasquale Daponte
Kim Fowler
John L. Schmalzel
Ruth A. Dyer
Kansas State University
Manhattan, KS, USA
For contributions to diversity in science and engineering education, and Hadamard-transform spectrometers.
Robert X. Gao
University of Massachusetts Amherst
Amherst, MA, USA
For contributions to condition monitoring and health diagnosis of machines through sensing methodologies.
Sorin Marcovici
Analogic Corporation
Lexington, MA, USA
For contributions to amorphous selenium flat panel detectors and x-ray detectors and to electronics for multi-slice CT scanners.
Marco Parvis
Politecnico di Torino Italy
Torino, Italy
For contributions to distributed data acquisition systems.
John L. Schmalzel
NASA-Stennis
Stennis Space Center, MS, USA
For leadership in engineering education.
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THE IMS HOME |
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IEEE Transactions on Instrumentation and Measurement |
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Instrumentation & Measurement Magazine |
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IEEE Spectrum |