"To Measure Is To Know"

Yicheng Wang

Yicheng Wang Headshot Photo
Yicheng
Wang

Yicheng Wang (M'96-SM'03-F’09) was born in Zhejiang, China, on January 17, 1960. He graduated from Zhejiang University in China with a B.A. degree in Physics in 1982.  He received a Ph.D. degree in atomic physics from the College of William and Mary, Williamsburg, VA, in 1987.

After receiving his Ph.D. degree, he continued at the College of William and Mary as a Post-Doctoral Associate until 1989. From 1990 to 1996,    he was a Research Staff at the Notre Dame Radiation Laboratory, U.S. Department of Energy. In 1996, he joined the National Institute of Standards and Technology, Gaithersburg, MD, where he has been working in the Quantum Electrical Metrology Division and where he is now Leader of the Farad and Impedance Metrology Project. His current work focuses on precision ac measurements and fundamental electrical units. He has served in the IEEE Power Engineering Society and shared a Working Group Recognition Award for Outstanding Technical Report. He currently chairs the TC-2 (DC-Low Frequency) of the IEEE I&M Society. He has been invited to serve on assessment teams for KRISS (Korea Research Institute of Standards and Science), South Korea, NRC (National Research Council), Canada, and CENAM(National Metrology Center), Mexico. His work has been recognized with a U.S. Dept. of Commerce Bronze Medal. He has more than 55 archival publications covering broad areas including atomic physics, scientific instrumentation, plasma chemistry, partial discharges, and fundamental electrical standards. He became IEEE Fellow in 2009 for contributions to precision electrical measurements in realization of the International System of Units Farad and Ohm.

National Institute of Standards and Technology (NIST)
Technical Committee Chair

Location

100 Bureau Drive , Stop 8172
Gaithersburg, MD 20899-8172
United States

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