2010 Awards

The Society presented its 2010 Society Awards at I²MTC 2011 in Binjiang, Hangzhou, China. Congratulations to the following recipients of the 2010 I&M Society Awards:

Instrumentation and Measurement Society Outstanding Young Engineer Award

The 2010 Outstanding Young Engineer Award recipient is:

 

Yan Zhai
Micron Technology Corporation, USA

"For advancement in stochastic signal processing for real-time data acquisition and surveillance measurements."

 

 

Instrumentation and Measurement Society Technical Award

The 2010 Technical Award recipient is:

Abdulmotaleb El Saddik
University of Ottawa, Canada

"For outstanding contributions to multimedia computing."

 

Instrumentation and Measurement Society Distinguished Service Award

The 2010 Distinguished Service Award recipient is:

 

Robert C. Rassa
Raytheon, USA

"For many years of invaluable dedication to the Instrumentation and Measurement Society."

 

Instrumentation and Measurement Society Career Excellence Award

The 2010 Career Excellence Award recipient is:

 

Asad M. Madni
BEI Technologies, Inc., USA

"For an extraordinary career of enlightened leadership in and pioneering contributions to the development and commercialization of intelligent sensors, systems and instrumentation."

 

 

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I&M Society 2011 Fellows

Voicu Zamfir Groza
University of Ottawa
Ottawa, Canada

"For contributions to floating-point analog-to-digital conversion."

 

 

 

 

 

Sergey N. Kharkovsky
Missouri University of Science & Technology
Rolla, MO, USA

"For contributions to microwave techniques for the evaluation of materials and structures."

 

 

 

 

Subhas Chandra Mukhopadhyay
Massey University
Palmerston North, New Zealand

"For development of low-cost smart sensors and sensing systems."

 

 

 

 

Yong Yan
University of Kent
Farningham, United Kingdom

"For contributions to pulverized fuel flow metering and combustion flame imaging."

 

 

 

 

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Instrumentation and Measurement Society Andy Chi Best Paper Award

The I&M Society Andy Chi Best Paper Award is awarded to recognize an author or authors of a paper published in the IEEE Transactions on Instrumentation and Measurement.

The 2009 Andy Chi Best Paper Award recipient is:

Jenny Wirandi, Wlodek Kulesza and Jiandan Chen
System Engineering, Electrical and I&C Engineering, Sweden

For the paper “An Adaptive Quality Assessment System – Aspect of Human Factor and Measurement Uncertainty”